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Reliability block diagram extensions for non-parametric probabilistic analysis

Philip C. Davis, Mitchell A. Thornton, Theodore W. Manikas. Reliability block diagram extensions for non-parametric probabilistic analysis. In Annual IEEE Systems Conference, SysCon 2016, Orlando, FL, USA, April 18-21, 2016. pages 1-6, IEEE, 2016. [doi]

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Philip C. Davis

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Mitchell A. Thornton

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Theodore W. Manikas

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