Pre-Election Testing and Post-Election Audit of Optical Scan Voting Terminal Memory Cards

Seda Davtyan, Sotiris Kentros, Aggelos Kiayias, Laurent Michel, Nicolas C. Nicolaou, Alexander Russell, Andrew See, Narasimha Shashidhar, Alexander A. Shvartsman. Pre-Election Testing and Post-Election Audit of Optical Scan Voting Terminal Memory Cards. In David L. Dill, Tadayoshi Kohno, editors, 2008 USENIX/ACCURATE Electronic Voting Workshop, July 28-29, 2008, San Jose, CA, USA, Proceedings. USENIX Association, 2008. [doi]

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