Khaled Day, Abdel Elah Al-Ayyoub. Minimal Fault Diameter for Highly Resilient Product Networks. IEEE Trans. Parallel Distrib. Syst., 11(9):926-930, 2000. [doi]
@article{DayA00,
title = {Minimal Fault Diameter for Highly Resilient Product Networks},
author = {Khaled Day and Abdel Elah Al-Ayyoub},
year = {2000},
url = {http://www.computer.org/tpds/td2000/l0926abs.htm},
researchr = {https://researchr.org/publication/DayA00},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Parallel Distrib. Syst.},
volume = {11},
number = {9},
pages = {926-930},
}