An Information Retrieval System for the Analysis of Systematic Defects in VLSI - researchr publication authors

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David L. DeMaris, Dan Maynard, Bette Bergman Reuter, Shi Zhong. An Information Retrieval System for the Analysis of Systematic Defects in VLSI. In 16th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2004), 15-17 November 2004, Boca Raton, FL, USA. pages 216-223, IEEE Computer Society, 2004. [doi]

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