Multisignal modeling for diagnosis, FMECA, and reliability

Somnath Deb, Sudipto Ghoshal, Amit Mathur, Roshan Shrestha, Krishna R. Pattipati. Multisignal modeling for diagnosis, FMECA, and reliability. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998. pages 3026-3031, IEEE, 1998. [doi]

Authors

Somnath Deb

This author has not been identified. Look up 'Somnath Deb' in Google

Sudipto Ghoshal

This author has not been identified. Look up 'Sudipto Ghoshal' in Google

Amit Mathur

This author has not been identified. Look up 'Amit Mathur' in Google

Roshan Shrestha

This author has not been identified. Look up 'Roshan Shrestha' in Google

Krishna R. Pattipati

This author has not been identified. Look up 'Krishna R. Pattipati' in Google