Debayan Deb, Anil K. Jain 0001. Look Locally Infer Globally: A Generalizable Face Anti-Spoofing Approach. IEEE Transactions on Information Forensics and Security, 16:1143-1157, 2021. [doi]
@article{DebJ21,
title = {Look Locally Infer Globally: A Generalizable Face Anti-Spoofing Approach},
author = {Debayan Deb and Anil K. Jain 0001},
year = {2021},
doi = {10.1109/TIFS.2020.3029879},
url = {https://doi.org/10.1109/TIFS.2020.3029879},
researchr = {https://researchr.org/publication/DebJ21},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Information Forensics and Security},
volume = {16},
pages = {1143-1157},
}