Fatigue measurement setup under combined thermal and vibration loading on electronic SMT assembly

Karsten M. Decker, René M. Rehmann, Mike Roellig, Karlheinz Bock. Fatigue measurement setup under combined thermal and vibration loading on electronic SMT assembly. Microelectronics Reliability, 87:125-132, 2018. [doi]

Authors

Karsten M. Decker

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René M. Rehmann

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Mike Roellig

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Karlheinz Bock

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