Vijay Degalahal, R. Ramanarayanan, Narayanan Vijaykrishnan, Yuan Xie, Mary Jane Irwin. The Effect of Threshold Voltages on the Soft Error Rate. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 503-508, IEEE Computer Society, 2004. [doi]
No reviews for this publication, yet.