Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle - researchr publication authors

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Thibault P. Delhaye, Nicolas Roisin, Nicolas André, Laurent A. Francis, Denis Flandre. Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle. In 2021 IEEE Sensors, Sydney, Australia, October 31 - Nov. 3, 2021. pages 1-4, IEEE, 2021. [doi]

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