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C. Delorme, P. Roux, L. Demians d Archimbaud, N. Giambiasi, R. L Bath, B. MacGee, R. Charroppin. A functional partitioning expert system for test sequences generation. In Hillel Ofek, Lawrence A. O Neill, editors, Proceedings of the 22nd ACM/IEEE conference on Design automation, DAC 1985, Las Vegas, Nevada, USA. pages 820-824, ACM, 1985. [doi]

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