Fast Compatibility Testing for Rooted Phylogenetic Trees

Yu Deng, David Fernández-Baca. Fast Compatibility Testing for Rooted Phylogenetic Trees. In Roberto Grossi, Moshe Lewenstein, editors, 27th Annual Symposium on Combinatorial Pattern Matching, CPM 2016, June 27-29, 2016, Tel Aviv, Israel. Volume 54 of LIPIcs, Schloss Dagstuhl - Leibniz-Zentrum fuer Informatik, 2016. [doi]

@inproceedings{DengF16,
  title = {Fast Compatibility Testing for Rooted Phylogenetic Trees},
  author = {Yu Deng and David Fernández-Baca},
  year = {2016},
  doi = {10.4230/LIPIcs.CPM.2016.12},
  url = {http://dx.doi.org/10.4230/LIPIcs.CPM.2016.12},
  researchr = {https://researchr.org/publication/DengF16},
  cites = {0},
  citedby = {0},
  booktitle = {27th Annual Symposium on Combinatorial Pattern Matching, CPM 2016, June 27-29, 2016, Tel Aviv, Israel},
  editor = {Roberto Grossi and Moshe Lewenstein},
  volume = {54},
  series = {LIPIcs},
  publisher = {Schloss Dagstuhl - Leibniz-Zentrum fuer Informatik},
  isbn = {978-3-95977-012-5},
}