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Franck Derieux, Mihaela Bobeica, Delphine Pois, Jean Pierre Raysz. Combining Semantics and Statistics for Patent Classification. In Martin Braschler, Donna Harman, Emanuele Pianta, editors, CLEF 2010 LABs and Workshops, Notebook Papers, 22-23 September 2010, Padua, Italy. 2010. [doi]

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