Testing wireless transceivers' RF front-ends utilizing defect-oriented BIST techniques - researchr publication authors

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Lampros Dermentzoglou, John Liaperdos, Angela Arapoyanni, Yiorgos Tsiatouhas. Testing wireless transceivers' RF front-ends utilizing defect-oriented BIST techniques. In 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012. pages 961-964, IEEE, 2012. [doi]

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