Hervé Deslandes, T. R. Lundquist. Limitations to photon-emission microscopy when applied to hot devices. Microelectronics Reliability, 43(9-11):1645-1650, 2003. [doi]
@article{DeslandesL03,
title = {Limitations to photon-emission microscopy when applied to hot devices},
author = {Hervé Deslandes and T. R. Lundquist},
year = {2003},
doi = {10.1016/S0026-2714(03)00291-9},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00291-9},
researchr = {https://researchr.org/publication/DeslandesL03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {9-11},
pages = {1645-1650},
}