Uncertainty-Guided Metric Learning Without Labels

Dhanunjaya Varma Devalraju, C. Chandra Sekhar. Uncertainty-Guided Metric Learning Without Labels. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2025, Tucson, AZ, USA, February 26 - March 6, 2025. pages 7029-7038, IEEE, 2025. [doi]