A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test - researchr publication authors

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V. R. Devanathan, C. P. Ravikumar, V. Kamakoti. A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]

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