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Stamp and logo detection from document images by finding outliers

Soumyadeep Dey, Jayanta Mukherjee 0001, Shamik Sural. Stamp and logo detection from document images by finding outliers. In 2015 Fifth National Conference on Computer Vision, Pattern Recognition, Image Processing and Graphics (NCVPRIPG), Patna, India, December 16-19, 2015. pages 1-4, IEEE, 2015. [doi]

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Soumyadeep Dey

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Jayanta Mukherjee 0001

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Shamik Sural

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