Yejia Di, Liang Shi, Shuo-Han Chen, Chun Jason Xue, Edwin Hsing-Mean Sha. 1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems. In Jian-Jia Chen, Aviral Shrivastava, editors, Proceedings of the 20th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2019, Phoenix, AZ, USA, June 23-23, 2019. pages 45-56, ACM, 2019. [doi]
@inproceedings{DiSCXS19,
title = {1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems},
author = {Yejia Di and Liang Shi and Shuo-Han Chen and Chun Jason Xue and Edwin Hsing-Mean Sha},
year = {2019},
doi = {10.1145/3316482.3326359},
url = {https://doi.org/10.1145/3316482.3326359},
researchr = {https://researchr.org/publication/DiSCXS19},
cites = {0},
citedby = {0},
pages = {45-56},
booktitle = {Proceedings of the 20th ACM SIGPLAN/SIGBED International Conference on Languages, Compilers, and Tools for Embedded Systems, LCTES 2019, Phoenix, AZ, USA, June 23-23, 2019},
editor = {Jian-Jia Chen and Aviral Shrivastava},
publisher = {ACM},
isbn = {978-1-4503-6724-0},
}