Sample-Optimal Identity Testing with High Probability

Ilias Diakonikolas, Themis Gouleakis, John Peebles, Eric Price. Sample-Optimal Identity Testing with High Probability. Electronic Colloquium on Computational Complexity (ECCC), 24:133, 2017. [doi]

@article{DiakonikolasGPP17,
  title = {Sample-Optimal Identity Testing with High Probability},
  author = {Ilias Diakonikolas and Themis Gouleakis and John Peebles and Eric Price},
  year = {2017},
  url = {https://eccc.weizmann.ac.il/report/2017/133},
  researchr = {https://researchr.org/publication/DiakonikolasGPP17},
  cites = {0},
  citedby = {0},
  journal = {Electronic Colloquium on Computational Complexity (ECCC)},
  volume = {24},
  pages = {133},
}