Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress - researchr publication authors

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Evan Dimech, John Frederick Dawson. Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 5924-5929, IEEE, 2018. [doi]

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