Using Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits

Michael Dimopoulos, Panagiotis Linardis. Using Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits. In Ioannis P. Vlahavas, Constantine D. Spyropoulos, editors, Methods and Applications of Artificial Intelligence, Second Hellenic Conference on AI, SETN 2002. Thessaloniki, Greece, April 11-12, 2002, Proceedings. Volume 2308 of Lecture Notes in Computer Science, pages 485-493, Springer, 2002. [doi]

@inproceedings{DimopoulosL02,
  title = {Using Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits},
  author = {Michael Dimopoulos and Panagiotis Linardis},
  year = {2002},
  url = {http://link.springer.de/link/service/series/0558/bibs/2308/23080485.htm},
  tags = {testing},
  researchr = {https://researchr.org/publication/DimopoulosL02},
  cites = {0},
  citedby = {0},
  pages = {485-493},
  booktitle = {Methods and Applications of Artificial Intelligence, Second Hellenic Conference on AI, SETN 2002. Thessaloniki, Greece, April 11-12, 2002, Proceedings},
  editor = {Ioannis P. Vlahavas and Constantine D. Spyropoulos},
  volume = {2308},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {3-540-43472-0},
}