Research on Fault Analysis Technology of Watt-hour Meter Based on Analytic Hierarchy Process

Li Ding, Dengping Tang, Wei Wei, Fan Li, Wenjia Cai. Research on Fault Analysis Technology of Watt-hour Meter Based on Analytic Hierarchy Process. In IEEE International Conference on Networking, Sensing and Control, ICNSC 2020, Nanjing, China, October 30 - November 2, 2020. pages 1-6, IEEE, 2020. [doi]

@inproceedings{DingTWLC20-0,
  title = {Research on Fault Analysis Technology of Watt-hour Meter Based on Analytic Hierarchy Process},
  author = {Li Ding and Dengping Tang and Wei Wei and Fan Li and Wenjia Cai},
  year = {2020},
  doi = {10.1109/ICNSC48988.2020.9238065},
  url = {https://doi.org/10.1109/ICNSC48988.2020.9238065},
  researchr = {https://researchr.org/publication/DingTWLC20-0},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {IEEE International Conference on Networking, Sensing and Control, ICNSC 2020, Nanjing, China, October 30 - November 2, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-6855-5},
}