On the Way to Big Data Applications in Industrial Computed Tomography - researchr publication authors

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Alexander Ditter, Dietmar Fey, Tobias Schon, Steven Oeckl. On the Way to Big Data Applications in Industrial Computed Tomography. In 2014 IEEE International Congress on Big Data, Anchorage, AK, USA, June 27 - July 2, 2014. pages 792-793, IEEE, 2014. [doi]

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