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An Enhanced Bug Mining for Identifying Frequent Bug Pattern Using Word Tokenizer and FP-Growth

K. Divyavarma, M. Remya, G. Deepa. An Enhanced Bug Mining for Identifying Frequent Bug Pattern Using Word Tokenizer and FP-Growth. In Suresh Chandra Satapathy, Vikrant Bhateja, Siba K. Udgata, Prasant Kumar Pattnaik, editors, Proceedings of the 5th International Conference on Frontiers in Intelligent Computing: Theory and Applications - FICTA 2016, Volume 1. Volume 515 of Advances in Intelligent Systems and Computing, pages 525-532, Springer, 2016. [doi]

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K. Divyavarma

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M. Remya

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G. Deepa

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