Kyung-Il Do, Byung-Seok Lee, Hee-Guk Chae, Jeong-Ju Seo, Yong-Seo Koo. A New Low Trigger SCR with Latch up Immunity for 5V Application. In 2nd European Conference on Electrical Engineering and Computer Science, EECS 2018, Bern, Switzerland, December 20-22, 2018. pages 524-527, IEEE, 2018. [doi]
@inproceedings{DoLCSK18,
title = {A New Low Trigger SCR with Latch up Immunity for 5V Application},
author = {Kyung-Il Do and Byung-Seok Lee and Hee-Guk Chae and Jeong-Ju Seo and Yong-Seo Koo},
year = {2018},
doi = {10.1109/EECS.2018.00102},
url = {https://doi.org/10.1109/EECS.2018.00102},
researchr = {https://researchr.org/publication/DoLCSK18},
cites = {0},
citedby = {0},
pages = {524-527},
booktitle = {2nd European Conference on Electrical Engineering and Computer Science, EECS 2018, Bern, Switzerland, December 20-22, 2018},
publisher = {IEEE},
isbn = {978-1-7281-1929-8},
}