Ngoc Chi Nam Doan, Van Tung Tran, Edward Kien Yee Yapp. Quality monitoring for injection moulding process using a semi-supervised learning approach. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{DoanTY21,
title = {Quality monitoring for injection moulding process using a semi-supervised learning approach},
author = {Ngoc Chi Nam Doan and Van Tung Tran and Edward Kien Yee Yapp},
year = {2021},
doi = {10.1109/IECON48115.2021.9589593},
url = {https://doi.org/10.1109/IECON48115.2021.9589593},
researchr = {https://researchr.org/publication/DoanTY21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3554-3},
}