Quality Assurance for ML Devices A Risk-Based Approach

Gonzalo Aguirre Dominguez, Keigo Kawaai, Hiroshi Maruyama. Quality Assurance for ML Devices A Risk-Based Approach. In 30th Asia-Pacific Software Engineering Conference, APSEC 2023, Seoul, Republic of Korea, December 4-7, 2023. pages 524-531, IEEE, 2023. [doi]

@inproceedings{DominguezKM23,
  title = {Quality Assurance for ML Devices A Risk-Based Approach},
  author = {Gonzalo Aguirre Dominguez and Keigo Kawaai and Hiroshi Maruyama},
  year = {2023},
  doi = {10.1109/APSEC60848.2023.00064},
  url = {https://doi.org/10.1109/APSEC60848.2023.00064},
  researchr = {https://researchr.org/publication/DominguezKM23},
  cites = {0},
  citedby = {0},
  pages = {524-531},
  booktitle = {30th Asia-Pacific Software Engineering Conference, APSEC 2023, Seoul, Republic of Korea, December 4-7, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-4417-2},
}