An on-chip combinational decompressor for reducing test data volume

Jie Don, Yu Hu, Yinhe Han, Xiaowei Li. An on-chip combinational decompressor for reducing test data volume. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

Authors

Jie Don

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Yu Hu

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Yinhe Han

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Xiaowei Li

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