Robust ellipse detection via arc segmentation and classification

Huixu Dong, I-Ming Chen, Dilip K. Prasad. Robust ellipse detection via arc segmentation and classification. In 2017 IEEE International Conference on Image Processing, ICIP 2017, Beijing, China, September 17-20, 2017. pages 66-70, IEEE, 2017. [doi]

@inproceedings{DongCP17-0,
  title = {Robust ellipse detection via arc segmentation and classification},
  author = {Huixu Dong and I-Ming Chen and Dilip K. Prasad},
  year = {2017},
  doi = {10.1109/ICIP.2017.8296244},
  url = {https://doi.org/10.1109/ICIP.2017.8296244},
  researchr = {https://researchr.org/publication/DongCP17-0},
  cites = {0},
  citedby = {0},
  pages = {66-70},
  booktitle = {2017 IEEE International Conference on Image Processing, ICIP 2017, Beijing, China, September 17-20, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-2175-8},
}