Scattering Parameters and Surface Normals from Homogeneous Translucent Materials Using Photometric Stereo

Bo Dong, Kathleen D. Moore, Weiyi Zhang, Pieter Peers. Scattering Parameters and Surface Normals from Homogeneous Translucent Materials Using Photometric Stereo. In 2014 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014, Columbus, OH, USA, June 23-28, 2014. pages 2299-2306, IEEE, 2014. [doi]

Authors

Bo Dong

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Kathleen D. Moore

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Weiyi Zhang

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Pieter Peers

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