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Multi-class Blind Steganalysis Based on Image Run-Length Analysis

Jing Dong, Wei Wang, Tieniu Tan. Multi-class Blind Steganalysis Based on Image Run-Length Analysis. In Anthony T. S. Ho, Yun Q. Shi, H.-J. Kim, Mauro Barni, editors, Digital Watermarking, 8th International Workshop, IWDW 2009, Guildford, UK, August 24-26, 2009. Proceedings. Volume 5703 of Lecture Notes in Computer Science, pages 199-210, Springer, 2009. [doi]

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Jing Dong

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Wei Wang

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Tieniu Tan

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