Brian P. Downey, Suzanne E. Mohney, Trevor E. Clark, Joseph R. Flemish. Reliability of aluminum-bearing ohmic contacts to SiC under high current density. Microelectronics Reliability, 50(12):1967-1972, 2010. [doi]
@article{DowneyMCF10-0,
title = {Reliability of aluminum-bearing ohmic contacts to SiC under high current density},
author = {Brian P. Downey and Suzanne E. Mohney and Trevor E. Clark and Joseph R. Flemish},
year = {2010},
doi = {10.1016/j.microrel.2010.07.007},
url = {https://doi.org/10.1016/j.microrel.2010.07.007},
researchr = {https://researchr.org/publication/DowneyMCF10-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {12},
pages = {1967-1972},
}