W. D. van Driel. Facing the challenge of designing for Cu/low-k reliability. Microelectronics Reliability, 47(12):1969-1974, 2007. [doi]
@article{Driel07,
title = {Facing the challenge of designing for Cu/low-k reliability},
author = {W. D. van Driel},
year = {2007},
doi = {10.1016/j.microrel.2007.04.009},
url = {http://dx.doi.org/10.1016/j.microrel.2007.04.009},
tags = {reliability},
researchr = {https://researchr.org/publication/Driel07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {12},
pages = {1969-1974},
}