Hao Du, Yan Qiu Chen. Rectified nearest feature line segment for pattern classification. Pattern Recognition, 40(5):1486-1497, 2007. [doi]
@article{DuC07:1,
title = {Rectified nearest feature line segment for pattern classification},
author = {Hao Du and Yan Qiu Chen},
year = {2007},
doi = {10.1016/j.patcog.2006.10.021},
url = {http://dx.doi.org/10.1016/j.patcog.2006.10.021},
tags = {classification},
researchr = {https://researchr.org/publication/DuC07%3A1},
cites = {0},
citedby = {0},
journal = {Pattern Recognition},
volume = {40},
number = {5},
pages = {1486-1497},
}