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Sem-Mask Enhanced Cross-modal Alignment for Event Causality Identification

Dawei Du, Luyuan Chen, Jun Shen, Lin Mu. Sem-Mask Enhanced Cross-modal Alignment for Event Causality Identification. In De-Shuang Huang, Chuanlei Zhang, Wei Chen 0036, Yijie Pan, Prashan Premaratne, editors, Advanced Intelligent Computing Technology and Applications - 22nd International Conference on Intelligent Computing, ICIC 2026, Toronto, ON, Canada, July 22-26, 2026, Proceedings, Part XXII. Volume 16663 of Lecture Notes in Computer Science, pages 360-371, Springer, 2026. [doi]

Authors

Dawei Du

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Luyuan Chen

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Jun Shen

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Lin Mu

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