Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem

XiaoSong Du, Praveen Gurrala, Leifur Leifsson, Jiming Song, William Q. Meeker, Ronald A. Roberts, Slawomir Koziel, Yonatan A. Tesfahunegn. Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem. In Yong Shi, Haohuan Fu, Yingjie Tian, Valeria V. Krzhizhanovskaya, Michael Harold Lees, Jack J. Dongarra, Peter M. A. Sloot, editors, Computational Science - ICCS 2018 - 18th International Conference, Wuxi, China, June 11-13, 2018, Proceedings, Part II. Volume 10861 of Lecture Notes in Computer Science, pages 593-603, Springer, 2018. [doi]

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