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Automatic Test Case Generation and Optimization Based on Mutation Testing

Yunqi Du, Ya Pan, Haiyang Ao, Nimako Ottinah Alexander, Yong Fan. Automatic Test Case Generation and Optimization Based on Mutation Testing. In 19th IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2019, Sofia, Bulgaria, July 22-26, 2019. pages 522-523, IEEE, 2019. [doi]

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Yunqi Du

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Ya Pan

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Haiyang Ao

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Nimako Ottinah Alexander

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Yong Fan

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