Improved Active Shape Model for automatic optical phase identification of microdrill bits in Printed Circuit Board production

Guifang Duan, Yen-Wei Chen. Improved Active Shape Model for automatic optical phase identification of microdrill bits in Printed Circuit Board production. In Proceedings of the International Conference on Image Processing, ICIP 2009, 7-10 November 2009, Cairo, Egypt. pages 425-428, IEEE, 2009. [doi]

Authors

Guifang Duan

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Yen-Wei Chen

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