Defective Surface Detection based on Improved Faster R-CNN

Han Duan, Jian Huang, Weike Liu, Feng Shu. Defective Surface Detection based on Improved Faster R-CNN. In IEEE International Conference on Industrial Technology, ICIT 2022, Shanghai, China, August 22-25, 2022. pages 1-6, IEEE, 2022. [doi]

Authors

Han Duan

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Jian Huang

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Weike Liu

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Feng Shu

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