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Amplitude characterization of memristive devices

João Capela Duarte, Ernesto Ventura Martins, Luis Nero Alves. Amplitude characterization of memristive devices. In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 45-48, IEEE, 2013. [doi]

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