Justin C. Dunlap, Morley M. Blouke, Erik Bodegom, Ralf Widenhorn. Dynamic CCD pixel depletion edge model and the effects on dark current production. In Ralf Widenhorn, Valérie Nguyen, Antoine Dupret, editors, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, Burlingame, California, USA, January 22-26, 2012. Volume 8298 of SPIE Proceedings, SPIE, 2012. [doi]
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