Don't Punish all of us: Measuring User Attitudes about Two-Factor Authentication - researchr publication authors

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Jonathan Dutson, Danny Allen, Dennis Eggett, Kent E. Seamons. Don't Punish all of us: Measuring User Attitudes about Two-Factor Authentication. In 2019 IEEE European Symposium on Security and Privacy Workshops, EuroS&P Workshops 2019, Stockholm, Sweden, June 17-19, 2019. pages 119-128, IEEE, 2019. [doi]

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