Discovering critical edge sequences in E-commerce catalogs

Kaushik Dutta, Debra E. VanderMeer, Anindya Datta, Krithi Ramamritham. Discovering critical edge sequences in E-commerce catalogs. In Proceedings 3rd ACM Conference on Electronic Commerce (EC-2001), Tampa, Florida, USA, October 14-17, 2001. pages 65-74, ACM, 2001. [doi]

@inproceedings{DuttaVDR01,
  title = {Discovering critical edge sequences in E-commerce catalogs},
  author = {Kaushik Dutta and Debra E. VanderMeer and Anindya Datta and Krithi Ramamritham},
  year = {2001},
  doi = {10.1145/501158.501166},
  url = {http://doi.acm.org/10.1145/501158.501166},
  tags = {e-science},
  researchr = {https://researchr.org/publication/DuttaVDR01},
  cites = {0},
  citedby = {0},
  pages = {65-74},
  booktitle = {Proceedings 3rd ACM Conference on Electronic Commerce (EC-2001), Tampa, Florida, USA, October 14-17, 2001},
  publisher = {ACM},
  isbn = {1-58113-387-1},
}