Features of JFET Computer Models in Microcurrent Mode on Exposure to Low Temperatures and Neutron Fluence

Oleg V. Dvornikov, Valentin Dziatlau, Vladimir A. Tchekhovski, Nikolay N. Prokopenko, Anna V. Bugakova. Features of JFET Computer Models in Microcurrent Mode on Exposure to Low Temperatures and Neutron Fluence. In IEEE East-West Design & Test Symposium, EWDTS 2020, Varna, Bulgaria, September 4-7, 2020. pages 1-5, IEEE, 2020. [doi]

@inproceedings{DvornikovDTPB20,
  title = {Features of JFET Computer Models in Microcurrent Mode on Exposure to Low Temperatures and Neutron Fluence},
  author = {Oleg V. Dvornikov and Valentin Dziatlau and Vladimir A. Tchekhovski and Nikolay N. Prokopenko and Anna V. Bugakova},
  year = {2020},
  doi = {10.1109/EWDTS50664.2020.9224827},
  url = {https://doi.org/10.1109/EWDTS50664.2020.9224827},
  researchr = {https://researchr.org/publication/DvornikovDTPB20},
  cites = {0},
  citedby = {0},
  pages = {1-5},
  booktitle = {IEEE East-West Design & Test Symposium, EWDTS 2020, Varna, Bulgaria, September 4-7, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-9899-6},
}