Jed Eastman. MCM Test Trade-Offs. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 367, IEEE Computer Society, 1994.
@inproceedings{Eastman94,
title = {MCM Test Trade-Offs},
author = {Jed Eastman},
year = {1994},
tags = {testing},
researchr = {https://researchr.org/publication/Eastman94},
cites = {0},
citedby = {0},
pages = {367},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}