Christof Ebert, Thomas Liedtke. An integrated approach for criticality prediction. In Sixth International Symposium on Software Reliability Engineering, ISSRE 1995, Toulouse, France, October 24-27, 1995. pages 14-23, IEEE, 1995. [doi]
@inproceedings{EbertL95,
title = {An integrated approach for criticality prediction},
author = {Christof Ebert and Thomas Liedtke},
year = {1995},
doi = {10.1109/ISSRE.1995.497639},
url = {http://dx.doi.org/10.1109/ISSRE.1995.497639},
researchr = {https://researchr.org/publication/EbertL95},
cites = {0},
citedby = {0},
pages = {14-23},
booktitle = {Sixth International Symposium on Software Reliability Engineering, ISSRE 1995, Toulouse, France, October 24-27, 1995},
publisher = {IEEE},
isbn = {0-8186-7131-9},
}