Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits

Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji. Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits. IET Circuits, Devices & Systems, 13(7):979-987, 2019. [doi]

Authors

Seyed Milad Ebrahimipour

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Behnam Ghavami

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Mohsen Raji

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