Failure Prediction Models for Proactive Fault Tolerance Within Storage Environments - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Benjamin Eckart, Xin Chen, Xubin He, Stephen L. Scott. Failure Prediction Models for Proactive Fault Tolerance Within Storage Environments. In Ethan L. Miller, Carey L. Williamson, editors, 16th International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunication Systems (MASCOTS 2008), Baltimore, Maryland, USA, September 8-10, 2008. pages 181-188, IEEE Computer Society, 2008.

This author has not been identified. Look up 'Benjamin Eckart' in GoogleThis author has not been identified. Look up 'Xin Chen' in GoogleThis author has not been identified. Look up 'Xubin He' in GoogleThis author has not been identified. Look up 'Stephen L. Scott' in Google

runs on WebDSL