An Efficient Deep Learning Paradigm for Deceit Identification Test on EEG Signals

Damodar Reddy Edla, Shubham Dodia, Annushree Bablani, Venkatanareshbabu Kuppili. An Efficient Deep Learning Paradigm for Deceit Identification Test on EEG Signals. ACM Trans. Management Inf. Syst., 12(3), 2021. [doi]

@article{EdlaDBK21,
  title = {An Efficient Deep Learning Paradigm for Deceit Identification Test on EEG Signals},
  author = {Damodar Reddy Edla and Shubham Dodia and Annushree Bablani and Venkatanareshbabu Kuppili},
  year = {2021},
  doi = {10.1145/3458791},
  url = {https://doi.org/10.1145/3458791},
  researchr = {https://researchr.org/publication/EdlaDBK21},
  cites = {0},
  citedby = {0},
  journal = {ACM Trans. Management Inf. Syst.},
  volume = {12},
  number = {3},
}