N. P. Edwards. The effect of certain modular design principles on testability. In Martin L. Shooman, Raymond T. Yeh, editors, Proceedings of the International Conference on Reliable Software 1975, Los Angeles, California, USA, April 21-23, 1975. pages 401-410, ACM, 1975. [doi]
@inproceedings{Edwards75-1,
title = {The effect of certain modular design principles on testability},
author = {N. P. Edwards},
year = {1975},
doi = {10.1145/390016.808463},
url = {https://doi.org/10.1145/390016.808463},
researchr = {https://researchr.org/publication/Edwards75-1},
cites = {0},
citedby = {0},
pages = {401-410},
booktitle = {Proceedings of the International Conference on Reliable Software 1975, Los Angeles, California, USA, April 21-23, 1975},
editor = {Martin L. Shooman and Raymond T. Yeh},
publisher = {ACM},
isbn = {978-1-4503-7385-2},
}